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Systematic analysis of electron traps of HfSiON/SiO2 nMOSFETs using TSCIS
Authors
Giyoun Roh
Hyeokjin Kim
BONG KOO KANG
Publication date
2 September 2019
Publisher
SSDM
Abstract
1
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포항공과대학교
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oai:oasis.postech.ac.kr:2014.o...
Last time updated on 15/05/2020