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Investigation of processing-induced defects in GaAs based vertical cavity surface emitting lasers with Al oxide confinement layers
Authors
Daniel, Cassidy
Jean-Pierre Landesman
+5 more
François Laruelle
Christophe Levallois
Merwan Mokhtari
Alain Moréac
Philippe Pagnod-Rossiaux
Publication date
20 August 2017
Publisher
HAL CCSD
Abstract
International audienc
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HAL-Rennes 1
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oai:HAL:hal-01710316v1
Last time updated on 17/04/2018