Electrically detected magnetic resonance (EDMR) is a commonly used technique
for the study of spin-dependent transport processes in semiconductor materials
and electro-optical devices. Here, we present the design and implementation of
a compact setup to measure EDMR, which is based on a commercially available
benchtop electron paramagnetic resonance (EPR) spectrometer. The electrical
detection part uses mostly off-the-shelf electrical components and is thus
highly customizable. We present a characterization and calibration procedure
for the instrument that allowed us to quantitatively reproduce results
obtained on a silicon-based reference sample with a “large-scale” state-of-
the-art instrument. This shows that EDMR can be used in novel contexts
relevant for semiconductor device fabrication like clean room environments and
even glove boxes. As an application example, we present data on a class of
environment-sensitive objects new to EDMR, semiconducting organic
microcrystals, and discuss similarities and differences to data obtained for
thin-film devices of the same molecule
