Capacity and leakage tests of nickel-cadmium secondary spacecraft cell

Bruess, E. C.

English

NASA Technical Reports Server

c 
N A D  CRANE, INDIANA 
I 
GPO PRICE $ 
OTS PRICE(S) $ 
Microfiche (MF)  
https://ntrs.nasa.gov/search.jsp?R=19650010267 2020-03-17T00:37:52+00:00Z
? -  
I ACCEPTAHCE TEST 
OF 
. 
-. EVALUATIOlV P R O W  
FOR 
EU3CONDARY SPACECRAFT C'EUS 
THIS FEPORT I S  LlMITED 110 O o V E B  AGEHCIES. 
OTHER REQ,UF,STS FOR COPIES SHDIILD BE MADE TOr 
WTIOHAL AERORAUTICS AND S€'A.CE AcIMIHISWmON 
GODDARD SPACE l%IOHT CEBTER (COIlE 636.2) 
G-T, M#lYLAD 20771 
E, C. BRmSS 
Manager, Electrochemical 
Power Sources Branch 
, 
~ 
QE/C 65-24 
REPORT BRlEF 
GULTON 12 AMPERE-HOUR CAllMNM 
SECONDARY SPACE- CELL8 
Ref: (a) Rational Aeronautics and Space Administration -chase 
(b) llAsA ltr RRA/VBIC/pad of 25 September 1961 w/BUWEPS f i r s t  
( e )  Preliminary Work Statement for  h t t e r y  Evaluation Program 
Order Number Wll,25B 
end FQ-1:WSK of 2 October 1961 t o  CO mAD Crane 
of  25 August 1961 
I. TEST ASSICllMEEZ BFtIEZ. 
A. In compliance wi th  references (a) and (b) ,  evaluation of 
Gulton Industries,  Inc. I 2  ampere-hour Secondary Spacecraft Cells 
w a s  begun according t o  the  program outline of reference ( c ) .  
B. The object of t h i s  evaluation program i s  t o  gather specif ic  
information concerning secondary spacecraft ce l l s .  
concerning performance characterist ics and l imitations,  including 
cycle l i f e  under various e l ec t r i ca l  and environmental conditions, 
w i l l  be of i n t e re s t  t o  power systems designers and users. C e l l  
weaknesses, including causes of  failure of present designs, w i l l  be 
of in te res t  t o  suppliers as a guide t o  product improvement, 
Information 
C, Thirty c e l l s  were purchased from Gulton Industries,  Inc., 
Metuchen, New Jersey by National Aeronautics and Space Administration 
(NASA). These c e l l s  a re  rated at 12 ampere hours by the manufacturer 
and are s i m i l a r  t o  those used in the OGO satellite program. 
11. CONCLUSIOHS . 
A.. From the results of t h i s  t e s t ,  it can be concluded that: 
1, The ceramic s e a l s  o f  these c e l l s  manufactured by Gulton 
Industries, Inc., are sat isfactory as evidenced by no leakers out 
of the 30 ce l l s  tested.  
2, The capacity o f  the c e l l s  was i n  the acceptable range 
of 13.6 t o  15.5 ampere-hours. 
111. RECOMMEnDATIOHS e 
A .  It i s  recommended that these Gulton Industries,  Inc. 12 
ampere-hour c e l l s  be accezted on the  basis o f ' t h e  acceptance test 
resu l t s ,  
i 
D. These ce l l s ,  rated by the manufacturer at 12.0 ampere-hours, 
were supplied i n  a dischesged (wi th  shorting wire) condition. 
IV- TEST PROCEDURES AND RESULTS. 
A. Capacity T e s t ,  
1, The capacity t e s t  is a determination of the  c e l l  capacity 
at the  c/2 discharge rate, where c i s  the manufacturer's ra ted  capacity 
t o  a cutoff voltage of 1.00 volt per cell.  The discharge was made 
a f t e r  a 1-hour open c i rcu i t  period following the  16-hour charge at 
the c/10 rate. 
facturer,  the  second and th i rd  capaclty checks were made a t  t h i s  
act ivi ty ,  The ce l l s  were discharged individually but were recharged 
in ser ies .  
Since one capacity check w a s  submitted by the manu- 
2. The c e l l  capacities of the second and t h i r d  capacity checks, 
made by this act ivi ty ,  generally were quite similar or s l igh t ly  lower 
than those submitted by t h e  manufacturer. The individual c e l l  capac- 
ities ranged from 13.6 t o  15.5 ampere-hours for an average o f  14.3 
ampere-hours. The c e l l  capacities a re  tabulated i n  Table I. Charac- 
t e r i s t i c  2-hour r a t e  discharge curves are shown in Figure 2. 
1. The c e l l  short t e s t  i s  a means of detecting s l igh t  shorting 
conditions which may ex i s t  because of imperfections i n  the  insulating 
materials, or damage t o  element i n  handling or assembly. 
2, Following completion of the t h i r d  capacity discharge test, 
each individual c e l l  was loaded with a res i s tor  of value giving a c 
t o  c/5 discharge rate and allowed t o  stand 16 hours with the r e s i s to r  
acting as a shorting device. A t  the  end of 16 hours, the  r e s i s to r s  
were removed and the  ce l l s  were placed on open c i r cu i t  stand for 24 
hours. 
higher was rejected.  
Any c e l l  whose voltage did not recover t o  1.15 vol t s  or 
3. The open c i rcu i t  c e l l  voltages, 24 hours a f t e r  removal 
of the shorting res i s tors ,  ranged from 1.20 t o  1.23 volts fo r  an 
average of 1.22 volts. .  
4. Of the 31 c e l l s  subjected t o  the c e l l  short t e s t ,  one 
was rejected. The voltage values for the  30 accepted c e l l s  a re  shown 
i n  Table I. 
C. Immersion Seal Test. 
1. 
of a sea l  or weld. 
charge t e s t  sequence t o  determine the presence and cause of leaks, 
The immersion sea l  t e s t  i s  a means of detecting leakage 
The t e s t  was performed befcre and a f t e r  the over- 
2 
2. The ce l l s  were place under water i n  a bel l  Jar container. 
A vacuum of 20 inches of mercury was held for  3 minutes- Cells 
discharging a steady stream of bubbles were considered re jec ts ,  
3. There were no rejects i n  the 30 ce l l s  subjected t o  the 
immersion seal test. 
D, Overcharae Test. 
1. The overcharge t e s t s  were performed t o  determine t h e  
steady state voltage at specified ratesI 
series of constant current charges a t  c/20,  C/LO and c/5 rates, fo r  
a m i n i m u m  of 48 hours at each charge rate or u n t i l  the increase of 
the "on-charge'' voltage was less  than 10 mil l ivol ts  per day, 
The test  specified a 
2. The c e l l s  were monitored hourly throughout the test. 
There was no need t o  remove any ce l l s  from the 
Charging w a s  t o  be discontinued on ce l l s  which exceeded 1.50 vol ts  
while on charge. 
charging sequence. 
3.  The steady s t a t e  voltage and temperature of each c e l l ,  
taken on the posit ive terminal, at the end of each @-hour chazge 
r a t e  test  is  shown in Table I. Characterist ic overcharge voltage 
curves a re  shown i n  Figure 3. 
E. Internal  Resistance Test, 
1. This test  was performed t o  determine the  internal  res i s -  
tance of the ce l l .  
2 ,  A t  the completion o f  the overcharge t e s t ;  t he  ce l l s  were 
returned t o  the c/20 charging r a t e  and given a short pulse (5-10 
seconds) at  a rate o f  c i n  amperes. 
a t e l y  pr ior  t o  the pulse; and V2, 5 milliseconds a f t e r  the  pulse, 
were read on a sui table  recording instrument, 
tape recorder (28.8 inches of tape per second) was used. 
resistance of the c e l l  i n  ohms w a s  calculated according t o  the following 
formula: 
The c e l l  voltages, V1, immedi- 
A CEC high speed 
The internal  
v2 - v1 R =  
I C  - Ic/20 
Vl and V2 are i n  volts,  IC and'Ic/20 a re  i n  amperes, 
3. The Internal resistance value for  each c e l l  i s  shown in  
The values range f r o m  0.87 milliohms t o  2-02 milliohms. Table 1. 
3 
B 
B 
t- 
0 
c9 
3 
m 
f 
rl 
R 
f 
% 
-? 
f 
rl 
d 
rl 
B 
8 
cu 
2 
‘9 
2i 
‘9 
m rl 
‘u 
5 
m 
‘9 
(u 
cn m 
0 
‘9 
0 0 W 
f 
9 
r?, 
d 
M 
f 
5 
E 
i2 
5 
0 
m 
4 
3 
rl 
(u m 
4 
s 
rl 
8 
-? 
rl 
rl 
E 
$2 
cu 
r- 
‘u 
? 
PI] rl
e: 
W rl
tn 
f rl
m 
N 
0’ 
0 m 
0 
‘9 
0 
0 
f 
‘9 
9 
6 
0 
tr 
f f rl 
E 
$2 
% 
0 
cu 
4 
f 
W 
rl 
f m 
”: 
-f 
rl 
t- co 
d 
rl 
f 
E 
8 
W 
2 
e: 
(u 
d 
‘9 
N? rl
9 
tn 
rl 
g: 
N 
0 m 
0 
‘9 
Ln 
N 
f 
‘9 
9 
m 
W tn
m 
f 
f rl 
In 
rl 
E; 
3 
3 
rl 
W m 
f 
rl 
4 
t- co 
rl 
d 
3 
E 
$2 
0 
rl 
N. 
‘9 
2 
tn 
f rl 
cu. 
tn 
ri 
m 
0‘ 
N 
tn a 
0 
‘9 
0 
0 
f 
‘9 
9 
6 
M 
5 
a, 
4 
E 
ln 
rl 
E; 
3 
4 
-? 
(u 
rl 
% 
f 
3 
rl 
r- co 
rl 
rl 
-? 
E 
8 
rl 
rl 
N. 
W 
N? 
rl 
N. 
f 
d 
9 
tn 
d 
m 
N 
‘9 
Lm m 
0 
‘9 
d E 
f 
9 
6 
& 
5 
rl 
!2 
In 
d 
p: 
cu 
4 
s 3 
rl 
;f m 
3 
d 
s 
co co 
cu 
d 
3 
E 
8 
rl 
rl 
N. 
‘9 
f rl 
9 
n 
rl 
? 
Ln 
rl 
Ln 
N 
‘9 
co co 
0 
‘9 
0 N 
f 
‘9 
lr. 
N 
6 
tn 
L n  
f 
ri 
E 
0 
zj 
LA 
rl 
t 
3 
3 
rl 
R 
f 
;f 
rl 
co co 
rl 
rl 
-? 
B 
8 
W 
rl 
cu. 
“9 
N rl
t 
m 
rl 
‘9 
f rl 
m 
N 
‘9 
0 
0 cT\
0 
72 
‘9 
f 
Ln 
co 
3 
‘0, 
f rl
E 
52 
In 
rl 
P; 
m 
0 rl
d 
4 
-f rn 
rl 
rl 
f 
CO co 
rl 
rl 
-? 
B 
8 
(u 
rl 
cu. 
9 
f rl 
‘9 
f rl
a 
f ri 
m 
‘9 
N 
\D m 
0 
‘9 
Ln 
N 
f 
‘9 
9 
6 
k 
m 
f r i  
E4 
i2 
In 
rl 
? 
W 
0 rl
(u 
rl 
-? 
N cn 
rl 
rl 
f 
r- co 
rl 
rl 
s. 
B 
8 
cu 
2 
E; 
0 rl 
ln 
tn 
d 
5 
tn 
d 
m 
N 
0‘ 
N m 
0 
‘9 
N 
rl 
f 
‘9 
9 
% 
tn 
2 
f rl 
~~ 
E 
$2 
In 
2 
m 
0 
rl 
m 
rl 
s 
cu m 
s rl 
rl 
cn 
s 
m 
rl 
r- 
E4 
8 
(u 
rl 
‘u 
‘9 
m 
rl 
T 
f rl
k 
f 
d 
m 
? 
N 
% 
? 
0 
0 a 
f 
tn 
f 
r?; 
z 
f rl 
~ 
B 
In 
rl 
e: 
3 
? 
rl 
3 
Cn 
rl 
rl 
4 
t- 
02 
0 
rl 
f 
B 
8 
(u 
rl 
N. 
‘9 
W 
rl 
9 
f rl 
‘9 
f rl
0 a
N 
rl m 
0 
‘9 
N 
rl 
3 
‘9 
9 
.s, 
\D 
0 W
f rl
? 
W 
rl 
N 
4 
f rl 
9 
-f 
d 
"7 
m 
d 
k 
N d 
4 
m 
d 
4 
f 4 
9 
5 
"9 
2 
Ln 
d 
m 
! 
f d 
T 
f rl
"? 
m 
d 
H f d 
Ln 
f 
d 
"9 
2 
'u. 
f rl 
? 
f d 
"9 
-s d 
4 
f rl 
Y 
f rl 
n 
3 d
T 
f rl 
4 
5 f rl 
9 
In 
d 
0' 
f rl 
4 
Ln 
rl 
9 
n 
rl 
Y 
f 
d 
c'! 
f rl 
9 
ln 
4 
"9 
f rl 
0' 
m 
rl 
n 
2+ 
Y 
f d 
'u. 
f d 
? 
f 
4 
m 
tn 
d d 
5 
Q,E/c 65-124 
FIGURE 1 
. 
7 

DISTRIBUTION LIST 
COPY NO. 
1-4 
5 
6 
7 
8 
9 
10 
11 
12-14 
15-17 
18-20 
21- 22 
23 
National Aeronautics and Space Administration, Goddard Space 
Flight Center ( M r  . Thomas Hennigan, Code 636), Greenbelt, 
Maryland 20771 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (Mr . Joseph Sherfey, Code 652), Greenbelt, 
Maryland 20771 
National Aeronautics and Space Administration, Goddard Space 
Flight Center ( M r .  W. I. Gould, Code 621), Greenbelt, 
Maryland 20771 
National Aeronautics and Space Administration (Mr. Ernst M. Cohn, 
Code RNW), Washington, D. C. 20546 
National Aeronautics and Space Administration ( M r .  James R. Miles, 
Code SL), Washington, D. C. 20546 
National Aeronautics and Space Administration ( M r .  A. M. Andms, 
Code ST), Washington, D. C. 20546 
National Aeronautics and Space Administration ( M r .  Arvin Smith, 
Code RNW), Washingtor,, D. C. 20546 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (Office of the Director), Greenbelt, 
Maryland 20771 
National Aeronautics and Space Administration, Gaddard Space 
Flight Center (Office of Assistant Director, Space Science 
and Satellite Applications), Greenbelt, Maryland 20771 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (Office of Assistant Cirector, Tracking and 
Data Systems), Greenbelt, Maryland 20771 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (Office of Technical Services), Greenbelt, 
Maryland 20771 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (GSFC Library), Greenbelt, Maryland 20771 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (Contracting Officer , Code 246), Greenbelt, 
Maryland 20771 
Y 
QEIC 65-124 
24-27 
28-30 
31 
32 
33 
34 
35 
36 
37 
38 
39 
40 
41 
National Aeronautics and Space Administration, Goddard Space 
Flight Center (Technical Information Division, Code 250), 
Greenbelt, Maryland 20771 
National Aeronautics and Space Administration, Scientific and 
Technical Information Facility, P. 0. Box 5700, Bethesda, 
Maryland 20014 
National Aeronautics and Space Administration, Ames Research 
Center (Mr. A. S. Hertzog/Mr. J. R. Swain), Moffett Field, 
California 9403 5 
National Aeronautics and Space Administration, Langley Research 
Center ( M r .  S. T. Peterson/Mr. Harry Ricker), Langley Station, 
Hampton, Virginia 23365 
National Aeronautics and Space Administration, Lewis Research 
Center ( M r .  Robert Miller), 21000 Brookpark Road, Cleveland, 
Ohio 44135 
National Aeronautics and Space Administration, Lewis Research 
Center (Mr. N. D. Sanders), 21000 Brookpark Road, Cleveland, 
Ohio 44135 
National Aeronautics and Space Administration, Lewis Research 
Center ( M r .  Robert L. Cummings), 21000 Brookpark Road, 
Cleveland, Ohio 44135 
National Aeronautics and Space Administration, Manned Space 
Craft Center (Mr. Richard Ferguson for EP-5), Houston, 
Texas 77058 
National Aeronautics and Space Administration, Manned Space 
Craft Center ( M r .  Robert Cohen), Houston, Texas 77058 
National Aeronautics and Space Administration, Manned Space 
Craft Center (Mr. James T. Kennedy), Houston, Texas 77058 
National Aeronautics and Space Administration, Manned Space 
Craft Center (Mr. Forrest E. Eastman, EE-4), Houston, 
Texas 77058 
National Aeronautics and Space Administration, Marshall Space 
Flight Center ( M r  . Philip Youngblood), Huntsville, 
Alabama 35812 
Jet Propulsion Laboratory (Mr. Aiji Uchiyama), 4800 O a k  Grove 
Drive, Pasadena, California 91103 
10 
' .  42 
43 
44 
45 
46 
47 
48 
49 
50 
51 
52 
53 
54 
55 
56 
U. S. Army Engineer R & D Labs. (Electrical Power Branch), 
Fort Belvoir, Virginia 22060 
U. S. Army Engineer R & D Labs. (MI. Arthar F. Daniel, Code 
SELRA/SL-PS), Fort Monmouth, New Jersey 07703 
U. S. Army Materiel Command, Harry Diamond Labs. (Mr. Nathan 
Kaplan), Room 300, Building 92, Connecticut Avenue & Van Ness 
Street, N.W., Washington, D. C. 20438 
U. S. Army Materiel Command, Research Division (Mr. John W. 
Crellin), AMCRD-RSCM T-7, Washington 25, D. C, 
Natick Labs., Clothing & Organic Materials Division ( M r .  Leo A. 
Spano/Mr . Robert N. Walsh) , Natick, Massachusetts 
U. S. Army TRECOM, Physical Sciences Group (SMOFE), Ft. Eustice, 
Virginia 23604 
U. S. Army Research Office ( M r .  Paul Greer/Dr. Wilhelm 
Jorgensen), Box CM, Duke Station, Durham, North Carolina 
U. S. Army Mobility Command, Research Division (Mr. 0. Renius, 
AMSMO-RR), Center Line, Michigan 48015 
Headquarters, U. S. Army Materiel Command, Development 
Division ( M r .  Marshall D. Aiken, AMCRD-DE-MO-P), 
Washington 25, D. C. 
Office of Naval Research (Dr. Ralph Roberts/Mr. H. W. Fox) 
Department of the Navy, Washington 25, D. C. 
Chief, Bureau of Naval Weapons (RAAE) , Navy Department, 
Washington, D. C. 20360 
Chief, Bureau of Ships (Mr. Bernard B. Rosenbaum, Code 340/ 
Mr. C. F. Viglotti, Code 660), Navy Department, 
Washington, D. C. 
Commanding Officer, U. S. Naval Ordnance Laboratory 
(Mr. William C. Spindler, Code 441), Corona, California 91720 
Commander, U. S. Naval Ordnance Laboratory White Oak 
(Mr. Philip B. Cole, Code WB), Silver Spring, Maryland 20919 
U. S. Naval Research Laboratory (Code 6160), 
Washington, D. C. 20390 
11 
57 
58 
59 
60 
61 
62 
63 
64 
65 
66 
67 
68 
69 
70- 7 5 
Wright-Patterson Air Force Base, Aeronautical Systems Division 
(Mr . James Elsworth Cooper), Dayton, Ohio 45433 
AF Cambridge Lab. (Mr. F. X. Doherty/Mr. Edward Raskind), 
L. G. Hanscom Field, Bedford, Massachusetts 01731 
Rome Air Development Center, ESD (Mr. F. J. Mollura), 
Griffiss Air Force Base, New York 13442 
CAFT William H. Ritchie, Space Systems Division (SSZAE-ll), 
A i r  Force Unit Post Office, Los Angeles, California 90045 
CAFT William Hoover, Air Force Ballistic Missile Division 
(WEZYA-21), Air Force Unit Post Office, Los Angeles, 
California 90045 
Office of the Deputy Commander AFSC for Aerospace Systems 
( M r .  W. J. Bennison), United States Air Force, Los Angeles, 
California 90045 
U. S. Atomic Energy Commission, Army Reactors, DRD, 
(Mr. Donald B. Hoatson), Washington, D. C. 20545 
Institute for Defense Analyses (Dr. G. Szego/Mr. R. Hamilton), 
400 Army-Navy Drive, Arlington, Virginia 22202 
National Bureau of Standards (Dr. W. J. Hamer), 
Washington 25, D. C. 
Power Information Center, University of Pennsylvania, Moore 
School Building, 200 South 33rd Street, Philadelphia, 
Pennsylvania 19104 
Office of Technical Services, Department of Commerce, 
Washington, D. C. 20009 
M r .  R. A. Eades, D.R.S., British Embassy, 3100 Massachusetts 
Avenue, N.W., Washington, D. C. 20008 
Canadian Joint Staff, Defense Research Member (WASA), 
2450 Massachusetts Avenue, N.W., Washington 25,  D. C. 
Gulton Industries, Alkaline Battery Division (Dr. Robert Shair) ~ 
Metuchen, New Jersey 08840 


Evaluation program for secondary spacecraft cells. acceptance test of gulton industries, inc. 12 ampere-hour cells

Abstract

Similar works

Full text

Available Versions

NASA Technical Reports Server