Total radiation dose and failure modes given for semiconductor devices exposed to neutron and gamma irradiatio

Hamman, D. J.

Hanks, C. L.

English

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RESEARCH REPORT 
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TWELFTH QUARTERLY REPORT 
on 
A STUDY OF THE RELIABILITY OF 
ELECTRONIC COMPONENTS I N  A NLJCLEAR- 
RADIATION ENVIRONMENT 
t o  
JET PROPULSION LABORATORY 
January 13, 1966 
C. L. Hanks and D. J. Hamman 
This w ~ r k  was performed f o r  t h e  Je t  Propuls ion  Laboratory,  
C a l i f o r n i a  I n s t i t u t e  of Technology, pursuant  t o  a sub- 
c o n t r a c t  i s sued  under Prime Contract  NAS7-100 between t h e  
C a l i f o r n i a  I n s t i t u t e  of Technology and t h e  United S t a t e s  
o f  America represented  by t h e  Nat ional  Aeornaut ics  and 
Space Adminis t ra t ion.  
BATTELLE MEMORIAL INSTITUTE 
COLUMBUS LABORATORIES 
505 King Avenue 
Columbus, Ohio 43201 
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TABU OF CONTENTS 
Page 
INTRODUCTION. 1 
PR%R.ESSSuMbfARy. . 1 
T E C H N I C A L D E T A I L S  2 
Measurement Status ....................... 2 
Results. ............................ 3 
Computed Statistic Sheets. . . . . . . . . . . . . . . . . . . .  5 
F U T U R E P L A N S . . . . . o . o . . . . . . . . o . . . . o . . . . . . .  6 
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A STUDY OF THE RELIABILITY OF 
ELECTRONIC COMPONENTS IN A NUCLEAR- 
RADIATION ENVIRONMENT 
by 
C. L. Hanks and D. J. Hamman 
INTRODUCTION 
This -s  the Twelfth Quarterly Report and the Th-rty-Seventh Mont.. Y 
Progress Report on Contract No. 950458 (File 2998) entitled "A Study of the 
Reliability of Electronic Components in a Nuclear-Radiation Environment". This 
report summarizes the project activity from October 1 to December 31, 1965, which 
has included approximately 1900 hours of additional radiation exposure for the 
electronic parts in Test Groups 111, V, and VI. 
9150 hours of exposure since the radiation exposure was initiated. 
measurements after 8000 hours of exposure were cumpleted during this period, and 
those following the completion of 9000 hours of exposure were started at the close 
of this report period. 
This makes a total of approximately 
The parameter 
PROGRESS SUMMARY 
Progress during this report interval has included the following project 
activities: 
1. Completion of the 8000-hour measurements on all component 
parts in the seven test groups. 
100 hours of high-flux radiation for the parts in Test Group IV. 
This is in addition to 
. . - . _. - . __ .  
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2. Completion of approximately 60 per cent of the 9000-hour 
measurements of the component parts in the seven test groups. 
Conversion of the 7000- and 8000-hour data cards as generated 
by the automatic data-recording system to the requirements of 
JPL Specification No. ZPP-2090-GEN. Data cards obtained from 
this conversion were shipped to the sponsor. 
3. 
TECHNICAL DETAILS 
Project effort during this report interim was directed toward the con- 
tinuation of the life tests that include nuclear radiation as an environmental 
condition and those that serve as control tests and exclude radiation as one of 
the environments. 
on all test parts when those in the radiation environment had completed 8000 and 
9000 hours of radiation exposure. The latter measurements were started at the 
close of this interim and are incomplete. In addition, computed statistic sheets 
covering test results through 7000 hours were received from the sponsor. 
As a part of this effort, parameter measurements were performed 
This section presents various details concerning these activities and 
the progress that has been made. 
Measurement Status 
Parameter measurements were completed according to schedule on all test 
groups when the parts in Test Groups 111, V, and VI had accumulated 8000 hours of 
radiation exposure during this report interval. In addition, the measurements 
after 9000 hours of accumulated radiation exposure were initiated as scheduled 
during the last week of this report interim but are incomplete at this time. 
. 
-3- 
The data cards generated in the performance of the 8000-hour measure- 
ments by the automatic data-recording system were processed with a computer 
program to obtain data cards in accordance with the format requirements of JPL 
Specification No. ZPP-2090-GEN. The output cards from this program were shipped 
to the sponsor. 
The conversion of the data cards from the 7000-hour measurements, which 
were completed at the close of the previous (eleventh) quarterly report period, 
was also completed during this interim with the output cards being shipped to the 
sponsor. 
Results 
Progress during this report interval has included the completion of 
2208 additional hours of operational load for an accumulated total of approxi- 
mately 11,000 operational hours for all test groups. The component parts in 
Test Groups 111, V, and VI have accumulated a total of 9150 hours of radiation 
exposure. 
operation and high-flux radiation exposure of the electronic parts in Test 
Group IV. 
The 11,090 hours of operational load are in addition to 100 hours of 
Table 1 is a listing of the additional component parts that have indicated 
failure during this report period. 
test groups listed in Table 1-are as follows: 
The environmental conditions for the various 
.- . . . . . . 
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T a b l e  1 
Group 
~~~ 
Tes t  Conditions 
I 100 C, 760 t o r r ,  o p e r a t i o n a l  
I1 100 C, t o r r ,  ope ra t iona l  
I11 100 C,  t o r r ,  ope ra t iona l  (a) 
IV 100 C,  t o r r ,  ope ra t iona l  0) 
V 50 C, t o r r ,  o p e r a t i o n a l  (a) 
100 C,  t o r r ,  s t a t i c  (a) VI 
VI1 100 C, 760 t o r r ,  s t a t i c  
~~ 
5 -1 (a) 10,000 hours  a t  3 x 10 n cm-2 s ec  
(b) 100 hours  a t  3 x 10 n cm’2 sec 
and 1 x.10 e r g s  g (C) h r  
5 -1 e r g s  g-’ (C) h r  
7 -1 -1 
and 1 x 10 
7 -1 
The fol lowing t a b l e  summarizes t h e  r a d i a t i o n  exposure of Test Groups 111, 
V,  and VI through 8079.3 hours  of exposure. The exposure va lues  l i s t e d  are 
averages over  t he  volumes of t he  capsules  occupied by t h e  t e s t  specimens. 
exposures l i s t e d  are f o r  f a s t  neut rons  only (i.e., E > 0.1 MeV). These va lues  
Neutron 
are based on neutron d i s t r i b u t i o n s  measured i n  mockups of t h e  r a d i a t i o n  capsu le s  
(see the Neutron Dosimetry Sec t ion  of  the  Supplement t o  the  F i r s t  Quar t e r ly  Report ,  
May 15, 1963, o r  t he  Revised Test Procedure f o r  JPL T e s t  No. 617, Phase 11, 
January 25, 1965) and do n o t  inc lude  p e r t u r b a t i o n s  due t o  test  components o r  
assembly o r  time-dependent d i s t r i b u t i o n  changes. P o s t i r r a d i a t i o n  a n a l y s i s  of 
i n - p i l e  neut ron  dos imeters  w i l l  provide more a c c u r a t e  de te rmina t ions  of a c t u a l  
doses  r ece ived  by i n d i v i d u a l  components o r  groups of components. 
Table 2. Approximate Neutron and Gamma Exposures 
I r r a d i a t i o n  
Per iod ,  
z Neutrons (n/cm ) Gamma rergs /g(c)  1 
Test Group Tes t  Groups Test Group T e s t  Groups 
hours V I11 and V I  v I11 and V I  
0 - 250 
250 - 500 
500 - 1000 
1000 - 2000 
2000 - 3000 
3000 - 4000 
4000 - 5000 
5000 - 6000 
6000 - 7000 
7000 - 8000 
T o t a l  In-Pile;? 
11 
11 
11 
11 
11 
11 
11 
11 
8.8 x 10’‘ 
11 
12 
2.4 x 10  2.8 x 10 
2.6 x 10 3.0 x 10 
3.9 x 10 4.6 x 10 
7.4 x LO 9.3 x 10 
7.5 x 10 8.8 x 10 
7.4 x 10 8.8 x 10 
7.5 x 10 8.8 x 10 
7.4 x 10 8.8 x 10 
7.5 x 10 
7-4 x 10 8.8 x 10 
6.2 x 10 7.3 x 10 
7 
7 
7 
8 
8 
8 
7 
8 
8 
7 
8 
2.64 x 10 2.62 x 10 
2.60 x 10 2.57 x 10 
5.31 x 10 5.29 x 10 
1.04 x 10 1.04 x 10 
1.12 x 10 1.12 x 10 
1.03 x 10 1.02 x 10 
9.81 x 10 9.76 x 10 
1.06 x 10 1.05 x 10 
1.02 x 10 1.02 x 10 
9.94 x 10 9.90 x 10 
8.34 x 10 8.30 x 10 
“Estimated i n t e g r a t e d  exposures from experimental  s t a r t u p  through BRR 
( B a t t e l l e  Research Reactor)  Cycie 194, 8079.3 ho l r rs  of a c c m u l a t e d  
r a d i a t i o n .  
Computed S t a t i s t i c  Sheets  
The f i r s t  r e s u l t s  of  the computed s t a t i s t i c  e f f o r t  a s s o c i a t e d  wi th  t h i s  
progran  w e r e  rece ived  from the  sponsor during t h e  l a t t e r  p a r t  of t h i s  program. 
These r e s u l t s  inc luded  computed s t a t i s t i c s  through t h e  7000-hour measurements 
such as t h e  minimum, mean, maximum, and s tandard  d e v i a t i o n  of each measured para-  
meter f o r  t h e  va r ious  p a r t  types be ing  t e s t ed .  
mean, maximum, and s tandard  d e v i a t i o n  of t h e  d e v i a t i o n  between measurements of a 
p a r t i c u l a r  parameter  were a l s o  included. 
The F and T va lues  and the  minimum, 
These da ta  have been scanned b r i e f l y ,  bu t  
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i n s u f f i c i e n t  time was a v a i l a b l e  between the r e c e i p t  of t h e  computed s ta t i s t ics  
shee t s  and the  end o f  t h i s  r e p o r t  pe r iod  t o  process  any of t hese  d a t a  f o r  t h i s  
r epor t .  
FUTURE PLANS 
The r a d i a t i o n  exposure and ope ra t iona l  l i f e  tests w i l l  be terminated 
during the  next  q u a r t e r l y  r e p o r t  i n t e r v a l .  The r a d i a t i o n  exposure w i l l  be d i s -  
continued a f t e r  approximately 9800 hours  of t o t a l  exposure. Data c a r d s  from t h e  
9000-hour measurement i n t e r v a l  and f i n a l  measurements w i l l  be shipped t o  t h e  
J e t  Propuls ion  LaSaraCory w i t h i n  one week fo l lowing  t h e  completion of  each se t  
of measurements. Work w i l l  a l s o  be s t a r t e d  on the  f i n a l  r e p o r t  du r ing  t h e  nex t  
q u a r t e r l y  r e p o r t  i n t e r v a l .  
Table 3. Identification of Additional Catastrophic Failures 
Type of Manufacturer's Test Specimen Hours at 
Component Part Number Group Number Failure Remarks 
Capac.i tor 
I I  
P323ZN2 
I I  
I11 
I1 
I11 
I 
I 
IV 
VI 
I11 
I11 
V 
V 
I11 
111 
I11 
I 
VI 
VI 
VI 
VI1 
VI1 
I11 
I11 
IV 
IV 
VI 
VI 
VI 
16 7000 
58 I I  
Capacitance and D.F. 
Capacitance and D.F. 
Capac i tor 6836 16 7000 Short 
Capacitor 
I 1  
HP56C50D1 
I I  
20 7000 
33 1 1  
Capacitance and D.F. 
Capacitance and D.F. 
Transistor 2N911 62 7000 h~~ 
h~~ 
h 
I IFE 
Transistor 2N914 112 7000 
Transistor 
I I  
2N915 
II 
01 7000 
13 I I  
Transis tor 
I I  
2N1050 
11 
81 7000 
83 1 1  
Trans is tor 
I I  
1 1  
I 1  
I 1  
11 
1 1  
1 1  
I t  
2N8 6 1 
I 1  
1 1  
I 1  
i I  
I I  
I I  
I I  
I 1  
03 7000 
08 
12 
20 
105 
108 
109 
123 
133 
I I  
1 1  
I 1  
1 1  
11 
I 1  
I I  
I 1  
h 
EE 
11 
1 1  
1 1  
I1 
- I I  
1 1  
I I  
Cap a c i t o r  
11 
11 
1 1  
I 1  
11 
! I  
P323ZN 
1 1  
I 1  
1 1  
11 
1 1  
1 1  
03 8000 
11 
64 
67 
102 
110 
117 
I t  
1 1  
11 
I I  
11 
1 1  
Capacitance and D.F. 
Ditto 
I I  
I 1  
I t  
I I  
1 1  
c 
Table 3. Continued 
Type of Manufacturer's Test Specimen Hours at 
Component Part Number Group Number Failure Remarks 
Capacitor HP 
II I 1  
Diode FD1184 
Diode FD643 
I 1  11 
I 1  II 
Diode 1N916 
I 1  I 1  
11 I 1  
Transistor 2N914 
1 1  II 
Transistor 2N915 
Transistor 2N1050 
1 1  I t  
II I 1  
I 1  I 1  
11 I 1  
I 1  11 
Transistor 2N2412 
!! 11 
Transistor 2N861 
11 I 1  
I 1  11 
I 1  11 
I 
I 
IV 
I 
IV 
IV 
I 
I1 
I1 
IV 
I 
IV 
I1 
I 
v 
V 
V 
V 
VI 
I11 
II 
I 
I 
I1 
VI1 
22 
35 
63 
29 
73 
74 
32-39 
41-49 
51-59 
74 
24 
67 
51 
29 
82 
84 
85 
95 
103 
17 
45 
37 
38 
53 
137 
8000 
11 
8000 
8000 
I 1  
I1 
8000 
I 1  
I 1  
I! 
8000 
11 
8000 
8000 
I 1  
I 1  
I 1  
11 
I 1  
8000 
II 
8000 
I 1  
11 
I 1  
Capacitance and D.F. 
Capacitance and D.F. 
Leakage 
Leakage 
11 
I 1  
v 
1 IF 
I1 
11 
H~~ 
%E 
11 
%E I1 
11 
11 
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A Study of the Reliability of Electronic Components in a Nuclear-radiation Environment Twelfth Quarterly Report, Oct. 1 - Dec. 31, 1965

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