Life tests on capacitors, diodes, controlled rectifiers, and transistors in nuclear radiation environmen

Hamman, D. J.

Hanks, C. L.

English

NASA Technical Reports Server

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ELEVEN” QUARTEiiLY REPORT 
on 
A STUDY OF THE RELIABILITY OF 
EZ;E’-?RONIC COMPONENTS IN A NUCLEAR- 
RADIATION ELVIROMEE 
to 
J E T  PROPULSION LABORATORY 
-C, L H a n k s _  and .D. J. Harmnan 
This  work w a s  performed f o r  the  J e t  Propuls ion  Laboratory,  
C a l i f o r n i a  I n s t i t u t e  of  Technology, pursuant  t o  a sub- 
c o n t r a c t  i s sued  under Prime Cont rac t  W7&00 between t h e  
C a l i f o r n i a  I n s t i t u t e  o f  Technology and t h e  United S t a t e s  
of America represented  by t h e  Nat iona l  Aeronaut ics  and 
Space Adminis t ra t ion.  
BATTELLE MEMORIAL INSTITUTE 
505 King Avenue 
Columbus, Ohio 43201 
https://ntrs.nasa.gov/search.jsp?R=19660007815 2020-03-16T23:02:47+00:00Z
TABLE OF CONTENTS 
Page 
INTRODUCTION ............................ 1 
PROGRESSSUIYMARY .......................... 1 
TECHNICAL DETAILS ......................... 2 
Neasurement S t a t u s  ...................... 2 
Results ............................ 3 
.EIU.IZEP.’S . . . . . . . . . . . . . . . . . . . . . . . . . . . .  5 
A STUDY OF Tti;;: ELIABILITY OF 
ELECTRONIC COKPOSEhTS IN A NUCLEAR- 
RDIATIOX EWIROhDIENT 
C .  L. Hanks and D. J. Hamman 
INTRODUCTION 
This is the Eleventh Quarterly Report and the Thirty-Fourth Monthly 
Progress Reprt on Contract Xo. 950458 (File 2998) entitled "A Study of the 
Reliability of Electronic Cmponents in a Nuclear-Radiation Environment". 
This report summarizes the project activity from July 1 to September 30, 1965, 
which has included approximately 1800 hours of additional radiation exposure 
for the electronic parts in Test Groups 111, V, and VI. This makes a total 
of approximately 7250 hours of exposure since the radiation exposure was 
initiated. The parameter measurements after 6000 and 7000 hours of exposure 
were also completed during this period. 
PROGRESS S W R Y  
Progress during this report interval has included the following project 
activities : 
(1) Completion of the 6000- and 7000-hour measurements on 
all component parts in the seven test groups. This is 
in addition to 100 hours of high-flux radiation for the 
parts in Test Group IV. 
-2- 
(2) Conversion of the 6000-hour data cards as generated by the 
automatic data-recording system to the requirements of JPL 
Specification No. ZPP-2090-GEN. The 7000-hour measurements 
were completed at the end of this report period, and the 
conversion of the data cards is incomplete, 
TECHNICAL DETAILS 
Project effort during this report interim was directed toward the 
continuation of the life tests that include nuclear radiation as an environmental 
condition. 
following the completion of 6000 and 7000 hours of radiation exposure. 
This section presents various details concerning these activities and 
A s  a part of this effort, parameter measurements were performed 
the progress that has been made. 
Mea suremen t Status 
Parameter rceasurements were completed according to schedule on all 
test groups when the parts in Test Groups 111, V ,  and V I  had accumulated 6000 
and 7000 hours of radiation exposure during this report interval. 
cards generated in the performance of the 6000-hour measurements by the automatic 
data-recording system were processed with a computer program to obtain data cards 
in accordance with the format requirements of JPL Specification No. ZPP-2090-GEN. 
The output cards from this program were shipped to the sponsor. 
The data 
The measurements,after 7000 hours of radiation exposure, were performed 
during the last week of this report period; and the conversion of the data cards 
was not completed prior to the end of this quarter. 
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-3-  
Results 
Progress during this report interva has included the completion of 
2208 additional hours of operational load for an accumulated total of approximately 
8790 operational hours for all test groups. 
Groups 111, V, and VI have accumulated a total of 7250 hours of radiation 
exposure. The 8790 hours of operational load are in addition to 100 hours of 
operation and high-flux radiation exposure of the electronic parts in Test 
Group IV. 
The component parts in Test 
Table 1 is a listing of the additional component parts that have 
indicated failure during this report period. 
not available for this report and will be included in the next monthly progress 
report. 
Table 1 are as follows: 
The 7000-hour failure data were 
The environmental conditions for the various test groups listed in 
Group Test Conditions 
I 100 C, 760 torr, operational 
I1 100 C, torr, operational 
I11 100 C, torr, operational (a) 
100 C, torr, operational (b) 
50 C y  torr, operational (4 
IV 
V 
(a) VI 100 C, torr, static 
VI1 100 C, 760 torr, static 
5 -1 (a) 10,000 hours at 3 x 10 n sec 
and 1 x 10 ergs g (C) hr 
(b) 100 hours at 3 x lo7 n cm sec 
and 1 x 10 ergs g (C) hr 
5 -1 -1 
-2 -1 
7 -1 -1 
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-4- 
* 
The following table sumnarizes the radiation exposure of Test 
Groups 111, V, and VI through 7209.1 hours of exposure. The exposure values 
listed are averages over the volumes of the capsules occupied by the test speci- 
mens. 
These values are based on neutron distributions measured in mockups of the 
irradiation capsules (see the Neutron Dosimetry Section of the Supplement to the 
First Quarterly Report, May 15, 1963, or the Revised Test Procedure for JTL 
Test No. 617, Phase 11, January 25, 1965) and do not include perturbations due 
to test components or assembly or time-dependent distribution changes. Post- 
irradiation analysis of in-pile neutron dosimeters will provide more accurate 
determinations of actual doses received by individual components or groups of 
components. 
Neutron exposures listed are for fast neutrons only (i.e., E > 0.1 MeV). 
APPROXIMATE NEUTRON AND GAMMA EXPOSURES 
Gamma rergs/g(c) 1 2 Irradiation Neutrons ( d c m  ) 
Period , Test Group Test Groups Test Group Test Groups 
hours V I11 and VI V I11 and VI 
~ 
7 
0 - 250 2.4 x 10 l1 2.8 x 10 2.64 x 10 2.62 x 10 
250 - 500 2.6 x 10 l1 3.0 x 10 
500 - 1000 3.9 x 10 4.6 x 10 5.31 x 10 5.29 x.10 
1000 - 2000 7.4 x 10 9.3 x 10 1.04 x 10 1.04 x 10 
2000 - 3000 7.5 x 10 8.8 x 10 1.12 x 10 1.12 x 10 
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2.57 x 10 7 2.60 x 10 
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3000 - 4000 7.4 x 10 l1 8.8 x 10 1.03 x 10 1.02 x 10 
6000 - 7000 7.5 x 10 l1 8.8 x 10 1.02 x 10 1.02 x 10 
Total In-Pile* 5.6 x 10 l2 6.5 x 10 7.47 x 10 7.43 x 10 
4000 - 5000 7.5 x 10 l1 8.8 x 10 9.81 x 10 9.76 x 10 
5000 - 6000 7.4 x 10 l1 8.8 x 10 1.06 x 10 1.05 x 10 
*Estimated integrated exposures from experiment startup through BRR 
(Battelle Research Reactor) Cycle 192, 7209.1 hours of accumulated 
irradiation. 
-5- 
FUTURE PLANS 
The radiation exposure and operational life tests will continue 
throughout the next quarterly report interval. This should include completion 
of approximately 9000 hours of accumulated irradiation with parameter measure- 
ments of the various component parts a t  the 8000- and 9000-hour intervals, 
Data cards will be shipped to the Jet Propulsion Laboratory within one week 
following the completion of each set of measurements, 
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TABLE 1. IDENTIFICATION OF ADDITIONAL CATASTROPHIC FAILURES 
Type of Manufacturer's Test Specimen Hours at 
Component Part Number Group Number Failure Remarks 
Capacitor 
11 
11 
11 
11 
11 
11 
11 
11 
I1 
I 1  
P323ZN2 
11 
11 
11 
11 
11 
11 
11 
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I11 
I1 
I1 
IV 
IV 
IV 
IV 
IV 
VI 
VI 
VI 
15 
42 
46 
64 
65 
67 
69 
73 
110 
115 
116 
6000 
6000 
6000 
6000 
6000 
6000 
6000 
6000 
6000 
6000 
6000 
Capacitor HP56C5ODl I 23 6000 
Diode FD643 I1 59 6000 Open 
Controlled 
Rectifier 3N58 
Transistor 2N911 
11 11 
Transistor 2N914 
11 11 
IH 
% B O  
hFE 
VI1 12 3 6000 
IV 78 6000 
v 95 6000 
'CBO 
%BO 
I11 05 6000 
I11 13 6000 
Transistor 2N915 I11 10 6000 
V 83 6000 
VI 114 6000 
Transistor 2N1050 V 95 6000 
VI 102 6000 
VI 107 6000 
VI 118 6000 
VI 119 6000 
hFE 
h~~ 
I 1  11 
11 11 
11 11 
11 11 
11 11 
11 11 
h~~ 
hFE 
11 11 VI1 121 6000 2 
Transistor 2N2412 V 95 6000 
-7- . 
TABLE 1 (Continued) 
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Type of Manufacturer's Test Specimen Hours at 
Component Part Number Group Number Failure Remarks 
&E 
h;E 
hFE 
hFE 
h~~ 
hFE 
Transistor 2N861 111 01 6000 
I11 19 6000 
I 27 6000 
VI 117 6000 
VI 119 6000 
VI1 136 6000 
VI1 138 6000 %E 
11 II 
11 11 
11 11 
11 11 
11 11 
11 I t  


A study of the reliability of electronic components in a nuclear-radiation environment Eleventh quarterly report, Jul. 1 - Sep. 30, 1965

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