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slides
The application of scanning electron microscopy to bulk devices. Part 1 - Gunn diodes
Authors
A. Gopinath
D. A. Shaw
D. V. Sulway
P. R. Thornton
Publication date
Publisher
Abstract
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diode
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oai:casi.ntrs.nasa.gov:1970002...
Last time updated on 02/09/2017
