Survival and development of Amblypelta nitida Stål, A. l. lutescens Distant (Hemiptera: Coreidae) and the egg parasitoid, Anastatus sp. (Hymenoptera: Eupelmidae) at constant rearing temperatures

Abstract

The effects of constant rearing temperatures on the development and survival of Amblypelta nitida, Amblypelta lutescens lutescens (Hemiptera: Coreidae) and their egg parasitoid, Anastatus sp. (Hymenoptera: Eupelmidae), were studied in the laboratory. Amblypelta nitida and A. l. lutescens survival and development were studied at 10,15, 20, 25,30 and 35 degrees C. The development rate of both species increased linearly with increasing temperature but insects only developed to adults at 20, 25 and 30 degrees C; at these temperatures, mean development times for A. nitida were 87, 64 and 29 days and forA. l. lutescens they were 93, 65 and 31 days respectively. No eggs of either species hatched at 10 degrees C and only A l. lutescens eggs hatched at 35 degrees C At all temperatures at which insects developed beyond the first instar, mortality rates were highest in the second instar for both species. Lower developmental threshold temperatures to complete development were 15.9 degrees C and 17.1 degrees C for A. nitida and A. l. lutescens respectively; A. nitida required 421 degree-days and A.l. lutescens required 404 degree-days to complete development. Anastatus sp. completed development at all six study temperatures and development times decreased from 54 days at 17.5 degrees C to 16 days at 30 degrees C; similarly Anastatus sp, survival increased with increasing temperature. The lower developmental threshold temperature and degree-days required for Anastatus sp. to complete development were 15.0 degrees C and 234 degree-days respectively. Results are discussed with respect to the different geographical distributions of A. nitida and A. l. lutescens and likely interactions with Anastatus sp. (C) 2016 Korean Society of Applied Entomology, Taiwan Entomological Society and Malaysian Plant Protection Society. Published by Elsevier B.V. All rights reserved