Bi-directional top hat D-Scan: single beam accurate characterization of nonlinear waveguides

Abstract

The characterization of a third order nonlinear integrated waveguide is reported for the first time by means of a top-hat Dispersive-Scan (D-Scan) technique, a temporal analog of the top-hat Z-Scan. With a single laser beam, and by carrying two counter-directional nonlinear transmissions to assess the input and output coupling efficiencies, a novel procedure is described leading to an accurate measurement of the TPA figure of merit, the effective Two-Photon Absorption (TPA) and optical Kerr (including the sign) coefficients. The technique is validated in a silicon strip waveguide for which the effective nonlinear coefficients are measured with an accuracy of $\pm 10~\%$Comment: 5 pages, 4 figure