We report on resistive switching of memristive electrochemical metallization
devices using 3D kinetic Monte Carlo simulations describing the transport of
ions through a solid state electrolyte of an Ag/TiOx/Pt thin layer
system. The ion transport model is consistently coupled with solvers for the
electric field and thermal diffusion. We show that the model is able to
describe not only the formation of conducting filaments but also its
dissolution. Furthermore, we calculate realistic current-voltage
characteristics and resistive switching kinetics. Finally, we discuss in detail
the influence of both the electric field and the local heat on the switching
processes of the device
