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Méthode de caractérisation large bande de fréquence de matériaux isolants par contact direct « sonde de mesure / échantillon »
Authors
Philippe Artillan
David Auchère
+5 more
Cédric Bermond
Benjamin Blampey
Bernard Flechet
Grégory Houzet
Thierry Lacrevaz
Publication date
19 March 2018
Publisher
HAL CCSD
Abstract
National audienc
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Hal - Université Grenoble Alpes
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oai:HAL:hal-01939115v1
Last time updated on 07/01/2019
HAL Université de Savoie
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oai:HAL:hal-01939115v1
Last time updated on 02/02/2019