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Buried heterostructure vertical-cavity surface-emitting laser with semiconductor mirrors

Abstract

We report a buried heterostructure vertical-cavity surface-emitting laser fabricated by epitaxial regrowth over an InGaAs quantum well gain medium. The regrowth technique enables microscale lateral confinement that preserves a high cavity quality factor (loaded QQ\approx 4000) and eliminates parasitic charging effects found in existing approaches. Under optimal spectral overlap between gain medium and cavity mode (achieved here at TT = 40 K) lasing was obtained with an incident optical power as low as PthP_{\rm th} = 10 mW (λp\lambda_{\rm p} = 808 nm). The laser linewidth was found to be \approx3 GHz at PpP_{\rm p}\approx 5 PthP_{\rm th}

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