To investigate leakage current density versus electric field characteristics,
epitaxial EuTiO3 thin films were deposited on (001) SrTiO3 substrates by pulsed
laser deposition and were post-annealed in a reducing atmosphere. This
investigation found that conduction mechanisms are strongly related to
temperature and voltage polarity. It was determined that from 50 to 150 K the
dominant conduction mechanism was a space-charge-limited current under both
negative and positive biases. From 200 to 300 K, the conduction mechanism shows
Schottky emission and Fowler-Nordheim tunneling behaviors for the negative and
positive biases, respectively. This work demonstrates that Eu3+ is one source
of leakage current in EuTiO3 thin films.Comment: 17 pages,4 figures, conferenc