'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
Measurements of the near-field intensity distributions of three lead-sulfide-selenide diode lasers operating near 4.8 μm have been made as a function of injection current. Localized emission in the near field exhibits peaked structure of full width from 5 to 10 μm for operation above threshold. From the dependence of the emission profiles on injection current estimates of 25 cm ^(-1) and 0.09 cm/A are made for the distributed loss and gain coefficients for one of the lasers. Optical confinement perpendicular to the p-n junction can be explained in terms of the homojunction properties
