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Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment
Authors
R. Brunner
N. Fujiwara
+7Â more
H. Gleskova
M. Jergel
S. Jurecka
H. Kobayashi
J. Mullerova
E. Pincik
M. Takahashi
Publication date
1 January 2004
Publisher
SPIE--The International Society for Optical Engineering.
Abstract
This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatmen
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oai:strathprints.strath.ac.uk:...
Last time updated on 17/11/2016
University of Strathclyde Institutional Repository
See this paper in CORE
Go to the repository landing page
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oai:strathprints.strath.ac.uk:...
Last time updated on 01/08/2012
