Recent developments in technology permit detailed descriptions of system performance to be collected and stored. Consequently, more data are available about the occurrence, or non-occurrence, of events across a range of classes through time. Typically this implies that reliability analysis has more information about the exposure history of a system within different classes of events. For highly reliable systems, there may be relatively few failure events. Thus there is a need to develop statistical inference to support reliability estimation when there is a low ratio of failures relative to event classes. In this paper we show how Empirical Bayes methods can be used to estimate a multivariate reliability function for a system by modelling the vector of times to realise each failure root cause
