Faturíková, Katarína

Koštial, Pavol

Marčeková, Lýdie

Pagáčová, Jana

Plško, Alfonz

Staňová, Iveta

English

DSpace at VSB Technical University of Ostrava

1 t·11r�JLIB Sborník vědeckých prací Vysoké školy báňské - Technické univerzity Ostrava číslo 3, rok 2009, ročník Lil, řada hutnická, článek č. 1549 Lýdie MARČEKOV Á1 , Iveta ST AŇOV Á2, Alfonz PLŠK02, Jana PAGÁČOV Á2, Katarína FATURÍKOVÁ2, Pavel KOŠTIAL3 INFLUENCE OF SOLS COMPOSITION ON TOPOGRAPHY OF TlO2 - S102 FILMS BY AFM SLEDOV ANIE VPL YVU ZLOZENIA SÓLOV NA TOPOGRAFlU TIO2 - S1O2 VRSTIEV POMOCOU AFM Continental Matador Rubber, Ltd., Technology Center, Púchov, S/ovak RepublicAlexander Dubček University of Trenčín, Faculty of lndustria/ Technologies, Púchov, Slovak Repub/ic,istanova@fpt.tnuni.skVŠB - Technica/ University of Ostrava, Facu/ty of Metallurgy and Materials Engineering, Ostrava,Czech RepublicAbstract Influence of composition of five initial sols on topography of prepared films on microscope slide glasses was observed and quantified in Ti(izoC3H7O)4 - Si{C2H5O)4 - HNO3 -Acetylacetone -izoC3H7OH - H2O system for preparation of TiO2 - SiO2 films. The topography of films on microscope slide glasses was performed with AFM apparatus (NT-206) operating in the air ambient conditions. Prepared films were characterized by average height z and standard deviation a, i.e. rms-roughness:Abstrakt V systéme Ti(izoC3H7O)4 - Si(C2H5O)4 - HNO3 - Acetylacetón - izoC3H7OH - H2O pre prípravu TiO2 - SiO2 filmov bol sledovaný a kantifikovaný vplyv zloženia piatich sólov na topografiu filmov nanesených na mikroskopických sklíčkach. Topografia hola sledovaná pomocou atómovej silovej mikroskopie (AFM). Pripravené filmy holi charakterizované priememou výškou z a štandardnou odchýlkou a nazývanou drsnost'. Key words: topography, TiO2- SiO2 films, AFM 1. IntroductionTitania - silica (TiO2 - SiO2) based films have aroused considerable interest for opticsapplication, including antireflective coatings and optical planar waveguides, due to their high thermal stability, high chemical durability, low thermal expansion coefficient, "and flexibly adjustable refractive index [l , 2]. ln addition, TiO2- SiO2 mixed oxides can also be considered as attractive materials for catalytic applications due to their high catalytic activity and selectivity [l]. Severa! techniques such as sol-gel, spray pyrolysis, chemical vapor deposition can be used to prepare titanium dioxide thin films. Among these preparation techniques, the relatively simple sol-gel method is the most widely used. A great deal of experimental work has been carried out on TiO2 -SiO2 thin film. It is well known that film properties are highly dependent upon the preparation process and surface microstructure. Therefore, the characterization of the microstructure of the surface ofthin films is vita! to improve the properties ofthin films [3, 4]. Atomic force microscopy (AFM) [5, 6] tumed out to be very useful for surface projection at nanolevel up to atomic level and for determination of their characteristics. It is used not only for determination of topography of TiO2 - SiO2 films, but also for characterization using roughness, eventually complex characterization using mathematic-statistical methods. It is also used at study of 135 

Sledovanie vplyvu zloženia sólov na topografiu TiO2-SiO2 vrstiev pomocou AFM

http://dspace.vsb.cz/bitstream/10084/78137/2/VSB%20HUF%202009-3_27_Marcekova.pdf

Sledovanie vplyvu zloženia sólov na topografiu TiO2-SiO2 vrstiev pomocou AFM

Abstract

Similar works

Full text

Available Versions

DSpace at VSB Technical University of Ostrava