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Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumption in Scan Test
Authors
Kimura Shinji
Otsuki Tatsuo
+3 more
Shi Youhua
Togawa Nozomu
Yanagisawa Masao
Publication date
1 November 2004
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
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Abstract
Abstract is not available.
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Last time updated on 17/02/2020
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Last time updated on 02/01/2018