research

Surface Charge Measurements with High Sensitivity and High Resolution Using Kelvin Probe Force Microscopy

Authors
Publication date
Publisher

Abstract

Abstract is not available.

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Osaka University Knowledge Archive

    redirect
    oaioai:ir.library.osaka-u.ac.jp:1...
    Last time updated on 03/05/2017