'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
This paper presents a tool based on a new approach for analyzing the locality exhibited by data memory references. The tool is very fast because it is based on a static locality analysis enhanced with very simple profiling information, which results in a negligible slowdown. This feature allows the tool to be used for highly time-consuming applications and to include it as a step in a typical iterative analysis-optimization process. The tool can provide a detailed evaluation of the reuse exhibited by a program, quantifying and qualifying the different types of misses either globally or detailed by program sections, data structures, memory instructions, etc. The accuracy of the tool is validated by comparing its results with those provided by a simulator.Peer ReviewedPostprint (published version
