In this article, we report that the origins of 1/f noise in pm-Si:H film resistors are inhomogeneity and defective structure. The results obtained are consistent with Hooge's formula, where the noise parameter, αH, is independent of doping ratio. The 1/f noise power spectral density and noise parameter αH are proportional to the squared value of temperature coefficient of resistance (TCR). The resistivity and TCR of pm-Si:H film resistor were obtained through linear current-voltage measurement. The 1/f noise, measured by a custom-built noise spectroscopy system, shows that the power spectral density is a function of both doping ratio and temperature

Jiang, Yadong

Li, Shibin

Li, Wei

Salamo, Gregory

Wang, Zhiming

Wu, Jiang

Wu, Zhiming

Ying, Zhihua

Nanoscale Research Letters

English

PubMed

Shibin Li

Yadong Jiang

Zhiming Wu

Jiang Wu

Zhihua Ying

Zhiming Wang

Wei Li

Gregory Salamo

Springer - Publisher Connector

NANO EXPRESS Open Access
Origins of 1/f noise in nanostructure inclusion
polymorphous silicon films
Shibin Li1,2, Yadong Jiang1, Zhiming Wu1*, Jiang Wu2, Zhihua Ying3, Zhiming Wang2*, Wei Li1 and
Gregory Salamo2
Abstract
In this article, we report that the origins of 1/f noise in pm-Si:H film resistors are inhomogeneity and defective
structure. The results obtained are consistent with Hooge’s formula, where the noise parameter, aH, is independent
of doping ratio. The 1/f noise power spectral density and noise parameter aH are proportional to the squared
value of temperature coefficient of resistance (TCR). The resistivity and TCR of pm-Si:H film resistor were obtained
through linear current-voltage measurement. The 1/f noise, measured by a custom-built noise spectroscopy system,
shows that the power spectral density is a function of both doping ratio and temperature.
Introduction
Nanostructure semiconductor has been the focus of
intense interest in recent years due to their extensive
device application [1-6]. It is well known that hydroge-
nated polymorphous silicon is a nanostructure inclusion
material [7-9]. Hydrogenated silicon films commonly
exhibit high noise at low frequency (f). This noise has a
spectral power density of the type S(f) ∝ 1/fa, where a is
known as “1/f noise.” However, lower noise materials
are important for high-performance semiconductor
devices. 1/f noise of amorphous and polycrystalline sili-
con has captured the attention of researchers in the
field of electronics and physics for several decades [10].
Polymorphous silicon film is generally prepared by oper-
ating a strong hydrogen-diluted silane plasma source at
high pressure and power density [11]. Many efforts have
been made concerning the growth process, microstruc-
ture, transport, and optoelectronic properties of pm-Si:H
films [12]. The results indicate that pm-Si:H films show
higher transport properties than a-Si:H, a highly desir-
able trait for the production of devices, such as solar
cells and thin film transistors. To date, pm-Si:H investi-
gations have focused on certain applications, but there
is no study devoted to the 1/f noise of such materials
except those by our group which have reported the
dependence of 1/f noise on the change of material struc-
ture of silicon films [13-15]. In this article, we focus on
the study of the origins of 1/f noise in pm-Si:H and
investigate the influence of boron doping ratio on 1/f
noise in pm-Si:H films.
Experimental
The pm-Si:H films were obtained by using RF PECVD
[11]. As shown in Figure 1a, Coplanar nickel electrodes
(about 50 nm) were evaporated onto the pm-Si:H films
and lifted off to make linear I-V contact. In Figure 1b,
in order to reduce external noise disturbance, the mea-
suring circuit was placed in a metal box. The noise and
electrical measurements were performed at various tem-
peratures using an ESL-02KA thermostat. Hall measure-
ments were performed using a BioRad HL5560 Hall
system coupled with helium cryostat. The structure of
pm-Si:H films was characterized using a SE850 spectro-
scopic ellipsometer with Bruggeman effective medium
model.
Results and discussions
The results in Table 1 show that pm-Si:H films depos-
ited at higher doping ratio were characterized by high
hydrogen content and crystalline fraction, and negligible
void fraction. As shown in Figure 2, because of its nano-
crystalline nature, the crystalline Raman peak of pm-Si:
H exhibits a frequency downshift and peak broadening
* Correspondence: zmwu@uestc.edu.cn; zmwang@uark.edu
1State Key Laboratory of Electronic Thin Films and Integrated Devices,
School of Optoelectronic Information, University of Electronic Science and
Technology of China (UESTC), Chengdu 610054, China
2Arkansas Institute for Nanoscale Materials Science and Engineering,
University of Arkansas, Fayetteville, AR 72701, USA
Full list of author information is available at the end of the article
Li et al. Nanoscale Research Letters 2011, 6:281
http://www.nanoscalereslett.com/content/6/1/281
© 2011 Li et al; licensee Springer. This is an Open Access article distributed under the terms of the Creative Commons Attribution
License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium,
provided the original work is properly cited.
Figure 1 Schematic of measurement system. (a) Schematic of coplanar electrode configuration for thin pm-Si:H film resistance measurement;
(b) schematic diagram of low-frequency noise measurement system.
Table 1 Structure and electrical properties for different doping ratios in pm-Si:H film
Sample Rv h (nm) R0 (MΩ) NC b (%) XC (%) H (%) Void (%)
A 10-2 326 2.42 4.24 × 1014 2.78 20 18 0
B 10-3 335 4.53 3.54 × 1013 2.93 18 16 0.5
C 10-4 341 6.76 4.23 × 1012 3.28 17 15 0.8
D 10-5 352 8.21 3.85 × 1011 3.45 14 13 1
Rv, gas doping ratio; h, film thickness (nm); NC, total number of carriers; TCR value-b (%), TCR = 1/R*(dR/dT)*100; resistivity at temperature of 300 K-R0 (MΩ); XC,
crystal volume fraction (%); H, hydrogen content (%); void, void volume fraction (%).
Li et al. Nanoscale Research Letters 2011, 6:281
http://www.nanoscalereslett.com/content/6/1/281
Page 2 of 5
caused by a phonon confinement effect. A peak (In) is
observed between 480 cm-1 (Ia: amorphous silicon) and
520 cm-1 (Ic: microcrystalline silicon). The crystalline
volume fraction XC of these films has been calculated
from the relation XC = (In + Ic)/(Ia + In + Ic) [13]. In
this study, the results have proven that the crystalline
volume fractions (XC) measured by SE and Raman spec-
troscopy are highly consistent.
Figure 3 shows a logarithmic plot of power spectral den-
sity, which is averaged over 30 measurements, versus fre-
quency for different doping ratios in pm-Si:H films at 300 K.
The decrease of noise is inversely proportional to frequency.
Moreover, the 1/f noise decreased with the increment of
boron doping ratio in pm-Si:H samples. Conventionally, the
results of 1/f noise measurements are discussed using Equa-
tion 1 originally introduced by Hooge [16]:
Sv
V2
=
αH
NCf
(1)
where Sv is the noise power density at voltage V, aH is
the noise parameter, f is frequency, and NC is the total
number of charge carriers in a certain volume involved
in noise generation. The total number of charge carriers,
determined by Hall measurement, in conjunction with
the dimension of the pm-Si:H film resistor, determines
the noise parameter aH as a function of frequency. Our
experimental results also demonstrate the 1/f noise
power scales with the square of bias voltage, which is in
agreement with the results of Fine et al. [17].
Figure 4 shows the relative voltage noise power Sv/V
2
at 100 Hz. We obtained that Sv/V
2 is constant at voltage
less than 1 V, which indicates that 1/f noise in pm-Si:H
film resistor does not originate from the resistance fluc-
tuations at 100 Hz under our experimental conditions.
Pm-Si:H film is generally accepted as inclusion material
in nanocrystalline and nanosized clusters [18]. The
above results indicate that pm-Si:H films are far from
being homogeneous, and thus, one could predict that
their electronic properties are affected by heterogeneity.
For the clarification of our results, the structure and 1/f
noise variations in amorphous, microcrystalline, and
pm-Si:H films were compared [13]. The results demon-
strate the dependence of 1/f noise in silicon film on the
structure variation. Paul and Dijkhuis [19] proved the
influence of metastable defect creation on the noise
intensity in hydrogenated amorphous silicon. Hence, we
also believe that the defects and heterogeneity cause 1/f
noise in pm-Si:H.
Figure 3 Log-log plot of power spectra density for various
doping ratios in pm-films at 50 mV bias.
Figure 4 Relative noise power at 100 Hz vs voltage. Relative
noise power demonstrates the dependence of 1/f noise in silicon
film on structure variation.
Figure 2 Raman spectroscopy of polymorphous silicon
samples. Raman spectroscopy for pm-Si:H samples (A, B, C, D), the
crystal volume fractions XC (%) obtained by Raman is consistent
with the results from SE measurements.
Li et al. Nanoscale Research Letters 2011, 6:281
http://www.nanoscalereslett.com/content/6/1/281
Page 3 of 5
The temperature dependence of 1/f noise in pm-Si:H
film resistor was also measured at 100 Hz for the various
boron doping pm-Si:H film resistors at temperatures
ranging from 300 to 420 K. In Figure 5a, the 1/f noise in
pm-Si:H film resistor decreases with the increasing tem-
perature. From the theoretical model proposed by Richard,
there is a correlation between Sv and the temperature
coefficient of resistance (TCR) given by Equation 2 [20]:
Sv ∝ V¯2β2
〈
(T)2
〉
(2)
where V¯ is the average voltage biased on the sample,
〈(ΔT)2〉 is mean-square temperature fluctuation, and b is
the value of TCR [13]. In the case of our measurement
condition, the value of V¯ and 〈(ΔT)
2〉 is the same for each
film resistor. Therefore, the power spectral density of 1/f
noise in pm-Si:H film resistors is proportional to squared
b (Sv(f) ∝ b2). The TCR is a function of resistivity in pm-Si:
H film resistors, which means that resistance fluctuation is
another origin of 1/f noise in the pm-Si:H resistors when
the measurement temperature changed significantly. Fig-
ure 5b shows that the temperature dependence of the total
charge carrier number in the measured volume also
decreases with increasing boron doping ratio. The more
highly doped the sample (such as sample A) the fewer the
dangling bonds and defects. Therefore, the variation in the
total charge carrier number for the higher-doped pm-Si:H
sample is lower. From Equation 1, we obtain
αH =
NCf
V2
Sv (3)
For each measured sample here, the values of NC, f, and
V2 are constant. The value of noise parameter aH at
100 Hz is plotted against temperature for different doping
ratios as shown in the inset of Figure 5b. The noise para-
meter aH for the pm-Si:H film resistors in this study is
also a function of the squared TCR (aH ∝ b2). It demon-
strated that the resistance fluctuation of the film samples
also resulted in the variation of noise parameter when the
measurement temperature changed dramatically.
Conclusions
The results of this study demonstrated that the origins of
1/f noise in nanostructure inclusion pm-Si:H are the
inhomogeneity and the defective structure in the films.
The power spectral density of 1/f noise is inversely pro-
portional to boron doping ratio, which is consistent with
Hooge’s formula. The value of Sv/V
2 is constant when the
voltage is less than 1 V, demonstrating that resistance
fluctuation is not the origin of 1/f noise in pm-Si film
resistors in the case of constant temperature. At 100 Hz,
the temperature dependence of 1/f noise indicates that
the power spectral density and the noise parameter aH
are proportional to the squared TCR. It has also been
proven that the resistance fluctuation of the film samples
also results in the variation of noise parameter when the
measurement temperature changed dramatically.
Abbreviations
TCR: temperature coefficient of resistance.
Acknowledgements
This work was partially supported by National Science Foundation of China
via grant No. 60901034 and 60425101.
Open access
This article is distributed under the terms of the Creative Commons
Attribution Noncommercial License which permits any noncommercial use,
distribution, and reproduction in any medium, provided the original author
(s) and source are credited.
Author details
1State Key Laboratory of Electronic Thin Films and Integrated Devices,
School of Optoelectronic Information, University of Electronic Science and
Technology of China (UESTC), Chengdu 610054, China 2Arkansas Institute for
Nanoscale Materials Science and Engineering, University of Arkansas,
Fayetteville, AR 72701, USA 3Department of Electronics and Information,
Hang Zhou Dianzi University, Hangzhou, 310018, China
Authors’ contributions
SL designed the experiments, carried out the sample preparation and 1/f
noise measurement. JW and ZY worked on organize data. All authors
participated in discussion on writing. All authors read and approved the final
manuscript.
Competing interests
The authors declare that they have no competing interests.
Received: 18 December 2010 Accepted: 4 April 2011
Published: 4 April 2011
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doi:10.1186/1556-276X-6-281
Cite this article as: Li et al.: Origins of 1/f noise in nanostructure
inclusion polymorphous silicon films. Nanoscale Research Letters 2011
6:281.
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Origins of 1/f noise in nanostructure inclusion polymorphous silicon films

AbstractIn this article, we report that the origins of 1/f noise in pm-Si:H film resistors are inhomogeneity and defective structure. The results obtained are consistent with Hooge's formula, where the noise parameter, αH, is independent of doping ratio. The 1/f noise power spectral density and noise parameter αH are proportional to the squared value of temperature coefficient of resistance (TCR). The resistivity and TCR of pm-Si:H film resistor were obtained through linear current-voltage measurement. The 1/f noise, measured by a custom-built noise spectroscopy system, shows that the power spectral density is a function of both doping ratio and temperature.</jats:p

Crossref

Mwakikunga BW: Thermally induced nano-structural and

Xia JB: Electronic structure of a hydrogenic acceptor impurity in semiconductor nano-structures. Nanoscale Res Lett

http://www.pubmedcentral.nih.gov/articlerender.fcgi?artid=3211346

Origins of 1/f noise in nanostructure inclusion polymorphous silicon films

Abstract

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