Electroluminescence in light-emitting devices relies on the encounter and radiative recombination of electrons and holes in the emissive layer. In organometal halide perovskite light-emitting diodes, poor film formation creates electrical shunting paths, where injected charge carriers bypass the perovskite emitter, leading to a loss in electroluminescence yield. Here, we report a solution-processing method to block electrical shunts and thereby enhance electroluminescence quantum efficiency in perovskite devices. In this method, a blend of perovskite and a polyimide precursor dielectric (PIP) is solution-deposited to form perovskite nanocrystals in a thin-film matrix of PIP. The PIP forms a pinhole-free charge-blocking layer, while still allowing the embedded perovskite crystals to form electrical contact with the electron- and hole-injection layers. This modified structure reduces nonradiative current losses and improves quantum efficiency by 2 orders of magnitude, giving an external quantum efficiency of 1.2%. This simple technique provides an alternative route to circumvent film formation problems in perovskite optoelectronics and offers the possibility of flexible and high-performance light-emitting displays.The authors acknowledge funding from the Gates Cambridge Trust, the Singapore National Research Foundation (Energy Innovation Programme Office), the KACST-Cambridge University Joint Centre of Excellence, the Royal Society/Sino-British Fellowship Trust, and the Engineering and Physical Sciences Research Council, UK. We also thank Dr. Alessandro Sepe for helpful discussions of the XRD data.This is the final version of the article. It first appeared from ACS via http://dx.doi.org/10.1021/acs.nanolett.5b0023
