High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

A. Imhof; A. Piazzalunga; Bahrdt; Carr; Carr; Chen; D. Zimoch; Flechsig; Follath; Follath; Ghiringhelli; Ghiringhelli; J. Krempasky; J. Raabe; Kotani; L. Patthey; Lidia; M. Grioni; Mooney; Nevière; Petersen; Petersen; Polack; Q. Chen; Quitmann; R. Betemps; Saitoh; Sasaki; Schlappa; T. Schmidt; T. Schmitt; Tanaka; U. Flechsig; V. N. Strocov; X. Wang

High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

Authors: A. Imhof
A. Piazzalunga
Bahrdt
Carr
Carr
Chen
D. Zimoch
Flechsig
Follath
Follath
Ghiringhelli
Ghiringhelli
J. Krempasky
J. Raabe
Kotani
L. Patthey
Lidia
M. Grioni
Mooney
Nevière
Petersen
Petersen
Polack
Q. Chen
Quitmann
R. Betemps
Saitoh
Sasaki
Schlappa
T. Schmidt
T. Schmitt
Tanaka
U. Flechsig
V. N. Strocov
X. Wang
Publication date: 16 December 2011
Publisher: International Union of Crystallography
Doi

Abstract

Concepts and technical realization of the high-resolution soft X-ray beamline ADRESS at the Swiss Light Source are described. Optimization of the optical scheme for high resolution and photon flux as well as diagnostics tools and alignment strategies are discussed

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