Dataset: RDF and TID simulation of PDSOI 45nm MOSFET

Authors
Publication date
Publisher
University of Southampton
Doi

    Abstract

    Dataset supporting: Chatzikyriakou, Eleni, Redman-White, William and De Groot, Kees (2016) Total Ionizing Dose, Random Dopant Fluctuations and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability.</span

      Similar works

      Full text

      thumbnail-image

      Available Versions

      Southampton (e-Prints Soton)

      redirect
      oaioai:eprints.soton.ac.uk:403024
      Last time updated on 01/02/2017