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Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications
Authors
Leonor Castrillón Peláez
Yolanda Fernández Nava
+4 more
María Elena Marañón Maison
Laura Megido Fernández
Luis Negral Álvarez
Beatriz Suárez Peña
Publication date
1 January 2016
Publisher
Doi
Abstract
Abstract is not available.
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Repositorio Institucional de la Universidad de Oviedo
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oai:digibuo.uniovi.es:10651/37...
Last time updated on 29/11/2016
