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蓝宝石图形衬底上GaN低温缓冲层的研究
Authors
吴猛
曾一平
王军喜
胡强
Publication date
1 January 2011
Publisher
Abstract
低温下,在蓝宝石图形衬底上使用金属有机化学气相沉积(MOCVD)生长低温GaN (LT-GaN)缓冲层,并对其表面形貌进行了细致的观察,发现了不同于已报道的GaN选择性成核生长现象。基于不同厚度的低温GaN缓冲层生长了n型GaN(n-GaN),发现过厚或者过薄的缓冲层都会对n-GaN晶体质量产生负面影响,并结合初始成核阶段进行了原因分析。制备了基于不同厚度的n-GaN的发光二极管(LED)样品,分析了GaN晶体质量对LED输出功率的影响。同时发现,晶体质量较差的时候,光提取效率可能主导着对LED器件性能的影响
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Last time updated on 29/11/2016