Diagnostic devices to precisely measure the longitudinal electron beam profile and the bunch arrival time require elaborate new instrumentation techniques. At FLASH, two entirely different methods are used. The bunch profile can be determined with high precision by a transverse deflecting RF structure, but the method is disruptive and does not allow to monitor multiple bunches in a macro-pulse train. It is therefore complemented by two non-disruptive electrooptical devices, called EO and TEO. The EO setup uses a dedicated diagnostic laser synchronized to the machine RF. The longitudinal electron beam profile is encoded in the intensity profile of a chirped laser pulse and analyzed by looking at the spectral composition of the pulse. The second setup, TEO, utilizes the TiSa-based laser system used for pump-probe experiments. Here, the temporal electron shape is encoded into the spatial dimension of the laser pulse by an intersection angle between the laser and the electron beam at the EO-crystal. In this paper, we present a comparative study of bunch length and arrival time measurements performed simultaneously with all three experimental techniques
