This paper details a novel, patent pending, abrasive machining manufacturing
process for the formation of sub-millimetre holes in THGEMs, with the intended
application in gaseous and dual-phase TPCs. Abrasive machining favours a
non-ductile substrate such as glasses or ceramics. This innovative
manufacturing process allows for unprecedented versatility in THGEM substrates,
electrodes, and hole geometry and pattern. Consequently, THGEMs produced via
abrasive machining can be tailored for specific properties, for example: high
stiffness, low total thickness variation, radiopurity, moisture
absorption/outgassing and/or carbonisation resistance. This paper specifically
focuses on three glass substrate THGEMs (G-THGEMs) made from Schott Borofloat
33 and Fused Silica. Circular and hexagonal hole shapes are also investigated.
The G-THGEM electrodes are made from Indium Tin Oxide (ITO), with a resistivity
of 150 Ω/Sq. All G-THGEMs were characterised in an optical (EMCCD)
readout GArTPC, and compared to a traditionally manufactured FR4 THGEM, with
their charging and secondary scintillation (S2) light production behaviour
analysed