Chalker, Paul R

Fang, Yuxiao

Lu, Qifeng

Mitrovic, Ivona Z

Mu, Yifei

Qi, Yanfei

Taylor, Stephen

Yang, Li

Yi, Ruowei

Zhao, Ce Zhou

Zhao, Chun

IEEE Transactions on Nuclear Science

The effects of biased irradiation on Ge MOS capacitors with HfxZr1-xOy(0.43 xZr1-xOy films were also examined. Gate leakage current density increases with the increasing of Zr composition in gate oxide. In addition, Zr-containing dielectrics under positive bias (PB) exhibited more oxide negative trapped charges than that of HfO2, which suggested that the oxygen-vacancy concentration in HfxZr1-xOy was increased by the addition of Zr. Larger flat-band voltage shifts (ΔVFB) were extracted under positive biased irradiation than the bias only results. The results indicate that radiation-induced interface traps (ΔNit) are the dominant factor for ΔVFB in HfO2 thin films, whereas the radiation response for Zr-containing dielectrics under PB was mainly due to oxide traps. Under negative biased irradiation, ΔVFB was attributed to the combined effect of the net oxide trapped charges and the passivation of Ge dangling bonds at the Ge/high-k interface. Additionally, both bias-induced and radiation-induced charge trapping have a crucial effect on radiation response of HfxZr1-xOy at each dose level. HfxZr1-xOy is identified as a promising gate dielectric for advanced complementary metal-oxide-semiconductor technologies

University of Liverpool Repository

Total Dose Effects and Bias Instabilities of (NH4)2S Passivated Ge MOS Capacitors With HfxZr1-xOy Thin Films

Yifei Mu

Yuxiao Fang

Ce Zhou Zhao

Chun Zhao

Qifeng Lu

Yanfei Qi

Ruowei Yi

Li Yang

Ivona Z. Mitrovic

Stephen Taylor

Paul R. Chalker

Crossref

Total Dose Effects and Bias Instabilities of (NH4)2S Passivated Ge MOS Capacitors With Hf&lt;italic&gt;x&lt;/italic&gt;Zr1–&lt;italic&gt;x&lt;/italic&gt;O&lt;italic&gt;y&lt;/italic&gt;Thin Films

Total Dose Effects and Bias Instabilities of (NH4)(2)S Passivated Ge MOS Capacitors With HfxZr1-xOy Thin Films

Total Dose Effects and Bias Instabilities of (NH4)(2)S Passivated Ge MOS Capacitors With HfxZr1-xOy Thin Films

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University of Liverpool Repository

Crossref