White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN.

Authors
Publication date
1 January 2001
Publisher

Abstract

Abstract is not available.

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Ghent University Academic Bibliography

    redirect
    oaioai:archive.ugent.be:143588
    Last time updated on 12/11/2016