Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic character
When this happens their performance can be improved
through compensation of the systematic portion of the
localization error In this paper we propose and analyze
a method for estimating the EL characteristic of subpixel EL techniques through statistical analysis of appropriate test images The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite signicant, which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views
