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A model for the chemistry of defects in bakelite plates exposed to high-radiation environment
Authors
A. Russo
Benussi
+6 more
D. Piccolo
D. Pierluigi
Ferdinando FELLI
L. Passamonti
Giovanna SAVIANO
T. Greci
Publication date
1 January 2012
Publisher
place:Trieste
Abstract
Results of a study on the formation of defects produced on the inner surface of the bakelite electrodes of RPC detectors are described. A mechanism for the formation of these defects is proposed
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Archivio della ricerca- Università di Roma La Sapienza
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Last time updated on 12/11/2016