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Characterization of amorphous/crystalline silicon interfaces from electrical measurements
Authors
A.S. Gudovskikh
Jean-Paul Kleider
Publication date
1 March 2008
Publisher
HAL CCSD
Abstract
International audienc
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HAL-CentraleSupelec
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oai:HAL:hal-00351211v1
Last time updated on 12/11/2016
HAL-CentraleSupelec
See this paper in CORE
Go to the repository landing page
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oai:HAL:hal-00351223v1
Last time updated on 12/11/2016