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Conductive-atomic force microscopy characterization of silicon nanowires
Authors
José Alvarez
Marie-Estelle Gueunier-Farret
+6 more
Jean-Paul Kleider
Irène Ngo
Simon Perraud
Pere Roca I Cabarrocas
E. Rouvière
Lianbo Yu
Publication date
1 September 2010
Publisher
HAL CCSD
Abstract
LGEP 2010 ID = 624International audienc
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Hal-Diderot
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oai:HAL:hal-00555251v1
Last time updated on 14/04/2021
HAL-CentraleSupelec
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oai:HAL:hal-00555251v1
Last time updated on 12/11/2016
