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Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires
Authors
José Alvarez
Morgane Fruzzetti
+7 more
Marie-Estelle Gueunier-Farret
Jean-Paul Kleider
Christine Morin
Irène Ngo
Simon Perraud
Pere Roca I Cabarrocas
Lianbo Yu
Publication date
1 December 2011
Publisher
HAL CCSD
Abstract
LGEP 2011 ID = 88
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Hal - Université Grenoble Alpes
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HAL Université de Savoie
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