International audienceIntegrating a power supply in the same die as the powered circuits is an appropriate solution for granular, fine and fast power management. To allow same-die co-integration, fully integrated DC-DC converters designed in the latest CMOS technologies have been greatly studied by academics and industrialists in the last decade. However, there is little study concerning the effects of the CMOS scaling on these particular circuits. To show the trends, this paper compares the achievable efficiencies of the 2:1 switched capacitor DC-DC converter topology under the same constraints in 65, 130 and 350nm bulk CMOS nodes and 28nm in bulk and FDSOI technologies with various capacitor options
