An Optical Boundary Scan Cell for On Line Testing of Embedded Systems

Authors
Publication date
1 January 2003
Publisher
HAL CCSD

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Hal - Université Grenoble Alpes

    redirect
    oaioai:HAL:hal-00194665v1
    Last time updated on 11/11/2016