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Structural and infrared spectral changes of silicon oxide grains by heat treatments

Abstract

In order to elucidate the relationship between crystallographic structures of amorphous silicon oxide grains and infrared (IR) spectra, ultrafine grains produced by the gas evaporation method have been studied on the basis of IR spectral measurements and electron microscopic (EM) observations. The shifts and disappearance in the IR absorption peaks of specimen heat-treated in air have been found. The spectral changes have been discussed in the relation with the polymorphism of silica

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