The MIRI/MRS Library I. Empirically correcting detector charge migration in unresolved sources

Abstract

The JWST has been collecting scientific data for over two years now. Scientists are now looking deeper into the data, which introduces the need to correct known systematic effects. Important limiting factors for the MIRI/MRS are the pointing accuracy, non-linearity, detector charge migration, detector scattering, the accuracy of the PSF model, and the complex interplay between these. The Cycle 2 programme 3779 proposed a 72-point intra-pixel dither raster of the calibration star 10-Lac. In this first work of the paper series, we aim to address the degeneracy between the non-linearity and BFE that affect the pixel voltage integration ramps of the MRS. Due to the low flux in the longer wavelengths, we only do this in the 4.9 to 11.7 micron region. We fitted the ramps per pixel and dither, in order to fold in the deviations from classical non-linearity that are caused by charge migration. The ramp shapes should be repeatable depending on the part of the PSF that is sampled. By doing so, we defined both a grid-based linearity correction, and an interpolated linearity correction. We find significant improvements compared to the uniform illumination assumption. The standard deviation on the pixel ramp residual non-linearity is between 70-90% smaller than the current standard pipeline when self-calibrating with the grid. We are able to interpolate these coefficients to apply to any unresolved source not on the grid points, resulting in an up to 70% smaller standard deviation on the residual deviation from linearity. The FWHM is up to 20% narrower. The depth of the fringes is now consistent up the ramp. Pointing-specific linearity corrections allow us to fix the systematic deviation in the slopes. We demonstrated this for unresolved sources. The discovered trends with PSF sampling suggest that, we may be able to model ramps for spatially extended and resolved illumination as well.Comment: 18 pages, 20 figures, Accepted for publication in A&