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Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments
Authors
F. Sagnard
D. Seetharamdoo
Christophe Vignat
Publication date
1 September 2002
Publisher
HAL CCSD
Abstract
International audienc
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HAL-Ecole des Ponts ParisTech
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oai:HAL:hal-00621814v1
Last time updated on 09/11/2016
HAL - UPEC / UPEM
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oai:HAL:hal-00621814v1
Last time updated on 07/05/2019