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Origin and observations of extended defects in III-V epilayers on Si
Authors
Charles Cornet
Olivier Durand
+4 more
Antoine Létoublon
Thanh Tra Nguyen
Anne Ponchet
Julien Stodolna
Publication date
11 June 2013
Publisher
HAL CCSD
Abstract
International audienc
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HAL-Rennes 1
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oai:HAL:hal-00918738v1
Last time updated on 09/11/2016
HAL-INSA Toulouse
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oai:HAL:hal-00918738v1
Last time updated on 07/05/2019