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Analysis of electrical transport properties of molecular layer on n-type silicon junction: Hg - OML - Si(111)
Authors
Soraya Ababou-Girard
Bruno Fabre
+5 more
Alain-Bruno Fadjie-Djomkam
Christian Godet
Cyril Herrier
R. Hiremath
Francine Solal
Publication date
1 January 2010
Publisher
HAL CCSD
Abstract
Abstract is not available.
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HAL-Rennes 1
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oai:HAL:hal-00919592v1
Last time updated on 09/11/2016