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Environmentally robust differential resonant accelerometer in a wafer-scale encapsulation process
Authors
Chae Hyuck Ahn
David L. Christensen
+4 more
Dongsuk D. Shin
Ian B. Flader
Thomas W. Kenny
Yunhan Chen
Publication date
1 January 2017
Publisher
IEEE
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info:doi/10.1109%2Fmemsys.2017...
Last time updated on 04/08/2021