High-speed, single-shot velocity-map imaging (VMI) is combined with carrier-
envelope phase (CEP) tagging by a single-shot stereographic above-threshold
ionization (ATI) phase-meter. The experimental setup provides a versatile tool
for angle-resolved studies of the attosecond control of electrons in atoms,
molecules, and nanostructures. Single-shot VMI at kHz repetition rate is
realized with a highly sensitive megapixel complementary metal-oxide
semiconductor camera omitting the need for additional image intensifiers. The
developed camerasoftware allows for efficient background suppression and the
storage of up to 1024 events for each image in real time. The approach is
demonstrated by measuring the CEP-dependence of the electron emission from ATI
of Xe in strong (≈1013 W/cm2) near single-cycle (4 fs) laser fields. Efficient
background signal suppression with the system is illustrated for the electron
emission from SiO2nanospheres
