Conferencia invitada presentada en la 14th International Conference on Noncontact AFM, celebrada en Lindau (Alemania).Improving spatial resolution, data acquisition times and material properties imaging
are some long established goals in atomic force microscopy (AFM). Currently, the most
promising approaches to reach those goals involve the excitation and detection of several
frequencies of the tip’s oscillation. Usually those frequencies are associated with either the
higher harmonics of the oscillation or the eigenmodes of the cantilever.
Bimodal AFM is an emerging multifrequency technique that is characterized by a high signal-to-noise ratio and
the versatility to measure simultaneously different forces. The method is also compatible
with molecular resolution imaging under the application of sub-50 pN peak forces.Peer Reviewe
