Characterization of semiconductor devices in terms
of their technological and geometrical parameters is de-
scribed in this paper. This characterization is generated
by a software tool composed of the SPICE-PAC simula-
tion package and the symbolic simulator SYBILIN. The
paper discusses the general structure of the program,
its principle of operation, some implementation details,
and its computational efficiency. A characterization of
Heterojunction Bipolar Transistor (HBT) for microwave
applications is used as an illustration