'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
A statistical approach to behavioral modeling for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited for avoiding unrealistic hypothesis of linearity, optimizing simulation, exploring operating conditions systematically, as well as verifying identification and validation uncertainty. An actual case study on the dynamic metrological characterization of a Fast Digital Integrator for high-performance magnetic measurements at the European Organization for Nuclear Research (CERN) is presented
