Study on the effect of contamination on the performance of X-ray telescopes

Abstract

Modifications were made to the X-ray reflectometer located at the Space Sciences Laboratory, Marshall Space Flight Center. One was an automatic drive for the Large Micrometer Head. This system, interfaced with the Hewlett Packard Computer System, is used to record data and provides the X-ray reflectometer with an automated data-taking capability. Using this system, a complete scatter curve can be obtained automatically. Previously, it was necessary to manually reset the system after recording for each data point in the scatter curve. The second modification provided an externally controlled electrical drive to move the microfocus X-ray source along its axis. With this modification, one can translate the X-ray source while it is operating to locate the position providing maximum count rate