Remotely sensing wheat maturation with radar

Abstract

The scattering properties of wheat were studied in the 8-18 GHz band as a function of frequency, polarization, incidence angle, and crop maturity. Supporting ground truth was collected at the time of measurement. The data indicate that the radar backscattering coefficient is sensitive to both radar system parameters and crop characteristics particularly at incidence angles near nadir. Linear regression analyses of the radar backscattering coefficient on both time and plant moisture content result in rather good correlation. Furthermore, by calculating the average time rate of change of the radar backscattering coefficient it is found that it undergoes rapid variations shortly before and after the wheat is harvested. Both of these analyses suggest methods for estimating wheat maturity and for monitoring the progress of harvest