Application of wheat yield model to United States and India

Abstract

The author has identified the following significant results. The wheat yield model was applied to the major wheat-growing areas of the US and India. In the US Great Plains, estimates from the winter and spring wheat models agreed closely with USDA-SRS values in years with the lowest yields, but underestimated in years with the highest yields. Application to the Eastern Plains and Northwest indicated the importance of cultural factors, as well as meteorological ones in the model. It also demonstrated that the model could be used, in conjunction with USDA-SRRS estimates, to estimate yield losses due to factors not included in the model, particularly diseases and freezes. A fixed crop calendar for India was built from a limited amount of available plot data from that country. Application of the yield model gave measurable evidence that yield variation from state to state was due to different mixes of levels of meteorological and cultural factors